Method and apparatus for measuring accumulated and

专利名称：Method and apparatus for measuring

accumulated and instant rate of materialloss or material gain

发明人：Kaj V. Nielsen,Lars V. Nielsen申请号：US11158272申请日：20050621

公开号：US20050263395A1公开日：20051201

专利附图：

摘要：Apparatus for measuring accumulated and instant rate of material loss ormaterial gain of metal elements for the detection of metal deposition and corrosion

includes a metal probe that is inserted into a measurement environment, causing theprobe to experience metal deposition or corrosion. The probe has a corrosion-resistantfirst section and a corrodible second section. A temperature-compensated circuitreceives an input signal from each of the first and second sections of the probe, wherebythe circuit maintains a substantially constant voltage across the first section andgenerates a reference signal and a measurement signal. The circuit conditions andconverts the reference signal and the measurement signal to produce first and seconddigitized output signals for inputting to a microprocessor.

申请人：Kaj V. Nielsen,Lars V. Nielsen

地址：Roskilde DK,Rodovre DK

国籍：DK,DK

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